CT-6 non-vacuum high and low temperature probe station
Sealed chamber, optimized design with low liquid nitrogen consumption. No frost, high precise screw drive structure, linear movement.
CGO-Variable temperature vacuum probe station
High vacuum chamber, 77K-673K(liquid nitrogen)/4.5K-673K(liquid helium) temperature range, Compatible with IV/CV/RF test, radiation isolating design.
CP200 semi-automatic alignment probe station
Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.
±1μm micropositioner
±1μm resolution, Swiss made precise screw, effective and precise for I-V/C-V /RF submicron probing test, highly rigid structure, spring loaded X-Y-Z, stable and backlash free
100fA leakage accurent triaxial probe holder
Triaxial/spring tube, leakage current up to 100fA, recommended to use with CB-40-T or higher precision micropositoners.
Kelvin / pulse probe
specification: Resolution: less than 10fA Probe pitch: from 12 to 100 μm can be customized according to requirements Very low parasitic capacitance
Electron microscope probe
PT-14-6705-B electron microscope probe
Optical fiber cold light source
Piezo motor, nano-scale stage
Triaxial (mother) to Coaxial (mother)
