3672 Series Vector Network Analyzers include 3672A (10MHz～13.5GHz), 3672B (10MHz～26.5GHz), 3672C (10MHz～40GHz), 3672D (10MHz～50GHz) and 3672E (10MHz～67GHz). 3672 analyzers provide multiple calibration types including frequency response, single port, response isolation, enhanced response and full dual-port, electronic calibration etc., offer various display formats such as logarithmic amplitude, linear amplitude, standing-wave, phase, group delay, Smith chart and polar coordinates, etc. They are designed with several standard interfaces: USB, LAN, GPIB and VGA etc. Besides all measurement functions same as traditional vector network analyzer, through configuration of functional options, 3672 analyzers are also capable of multifunctional & comprehensive parameter test of mixer/converter, gain compression two-dimensional sweep and pulse S-parameters, as well as accuracy measurement of amplitude-frequency characteristics, phase-frequency characteristics and group delay used in the field of transmitting/receiving (T/R) module measurement, dielectric material properties measurement, microwave pulse characteristics measurement and optoelectronic properties measurement, which are indispensable instruments for scientific research and manufacturing process of radar, communication, and navigation systems.
Available in multiple display formats such as logarithmic amplitude, linear amplitude, standing-wave, phase, Smith chart
With USB, GPIB, LAN and VGA display interface
12.1-inch-high resolution touch screen
Record/run, one-click operation greatly simplifies the measurement setting steps and improves the efficiency
Available in functions as pulse S parameter measurement, time-domain measurement, mixer measurement, gain compression two-dimensional sweep measurement, THz frequency extension, antenna & RCS measurement etc.
Simple and novel operation interface
Flexible and optional calibration types, compatible with multiple calibration kits
3672 Series of Vector Network Analyzers provide multiple calibration types, including smart Cal (guided calibration), unguided calibration (using mechanical calibration kit to conduct through response calibration, through response & isolation calibration and single port calibration, enhanced response calibration as well as full two-port SOLT calibration and TRL calibration) and electronic calibration (E-Cal) etc. Users can select calibration kits, such as coaxial 3.5mm calibration kit and electronic calibration kit based on test requirements, which greatly facilitates testing on devices with different interfaces.
Multiple windows to display all measuring channels
The analyzers possess functions of multi-channel and multi-window display, support up to 64 channels. Maximum 32 measuring windows can be simultaneously displayed, and each window can simultaneously display up to 16 test traces, which improves throughput and test productivity results.
Wide dynamic range
3672 Series of Vector Network Analyzers are designed with the concept of mixer receiving, which effectively extends the dynamic range of the complete machine and meets the test demand for wide dynamic range.
Abundant peripheral interfaces, flexible and practical
Adopting the software & hardware platform consisting of embedded computer module compatible with PC and Windows operation system, 3672 Series of Vector Network Analyzers realize the perfect combination of the instrument and PC. I/O interfaces (including GPIB, USB, and LAN, etc.) are the optimum selection for data communication.
Low trace noise, high test accuracy
The excellent performance of 3672 Series Vector Network Analyzers in trace noise highly improves the accurate measurement of low insertion loss devices. (Take 3672B as an example)
Time-domain analysis
With the time-domain option, 3672 Series Vector Network Analyzers computes the inverse Fourier transform of the frequency-domain data to display reflection or transmission coefficients versus time, which can detect the discontinuous points of DUT and locate the DTF accurately.
Automatic test
3672 Series Vector Network Analyzers can provide you integrated automatic test solutions to ensure high quality tests and decrease R&D costs of test significantly. Automatic test system is capable enough to help engineers accomplishing complicated tests under various complex environments.
