Analysis of High-Temperature Test and Measurement Probe Station System
Today, I will introduce you to the characteristics and technical parameters of the high-temperature test and measurement probe station system.
The main features of the high-temperature test and measurement probe station system are as follows:
It can be used for sample testing up to 12 inches.
It can be upgraded to a high-temperature probe station for 4/6/8/12-inch samples.
It features a coaxial screw drive structure for linear movement.
It can meet the requirements of 500-degree high-temperature testing with high temperature stability.
It is compatible with IV/CV/RF testing.
The structural design is simple and reasonable, and the operation is convenient.
It can be customized according to different needs.
The main technical parameters of the high-temperature test and measurement probe station system are as follows:
Model and Size:
There are four different models: CS-4-HT/CS-6-HT/CH-8-HT/CH-12-HT. Each model corresponds to a different sample stage size, ranging from 4 inches, 6 inches, 8 inches, and 12 inches, suitable for placing different samples.
Mechanical System:
Horizontal Rotation: The equipment can rotate 360 degrees and can be fine-tuned by 15 degrees with an accuracy of 0.1 degree. It also comes with an angle locking device to ensure stability during testing.
X-Y Movement Stroke: Depending on the model, the stroke range is from 4 inches to 8 inches.
X-Y Movement Accuracy: Ranging from 10 micrometers to 1 micrometer, indicating the precision of the equipment's movement on the X and Y axes.
Sample Fixation: Vacuum adsorption is adopted, with a central adsorption hole and multiple adsorption rings to ensure sample stability.
Optical System:
Microscope Types: Including monocular microscope, stereo microscope, and metallurgical microscope to meet different observation needs.
Magnification: Ranges from 16X-200X to 20X-4000X, providing a wide range of magnification options.
Movement Stroke: X-Y axis stroke of 2 inches * 2 inches/horizontal 360-degree rotation, and Z-axis stroke of 50.8mm.
Light Source: External LED ring light/coaxial light source.
CCD: Equipped with CCDs of different pixel counts, ranging from 2 megapixels to 12 megapixels, for image capture.
Positioner:
X-Y-Z Movement Stroke: 12mm12mm12mm
Movement Accuracy: 10 micrometers/2 micrometers/0.7 micrometers/0.5 micrometers
Adsorption Method: Magnetic adsorption/vacuum adsorption
Cables: Coaxial cables/triaxial cables
Leakage Precision: 10pA/100fA/10fA
Fixed Probe: Spring fixation/tubular fixation
Connector Types: BNC/triaxial/banana plug/crocodile clip/terminal block
Tip Diameter: 0.2 micrometers/1 micrometer/2 micrometers/5 micrometers/10 micrometers/20 micrometers
Tip Material: Tungsten steel/beryllium copper
Optional Accessories: Water cooling device, display, RF test accessories, shielded box, optical platform, photoelectric test accessories, high-voltage test accessories, laser system, probe card fixture, etc.
Overall, this test platform is a powerful and highly configurable system that can be customized according to different needs. The specifications of each component, from mechanical to optical to positioner, demonstrate its high performance and versatility.
